Research Facilities


Most of the processing in our group takes place in our own cleanroom (ISO Class 7).

We have the following facilities:

  • Wetbenches with spincoater, ovens etc.
  • Spincoaters in N2 atmosphere
  • Metal evaporators (N2 atmosphere)
  • Organic evaporator (N2 atmosphere)
  • Profilometer: Dektak XT
  • Maskless lithography: SmartForce Tech. SmartPrint
  • Dr. Blading and Dipcoating tools (N2 atmosphere) 

Material characterization

We use a broad set of (optical) techniques to charaterize the materialproperties. In our labs you can find:

  • Photoluminsecense setup based on a femtosecond laser and 2 streakcamera’s
  • Pump-probe transient absorption setup based on supercontinuum laser
  • Raman confocal microscope Renishaw inVia Qontor
  • Ellipsometer J.A.Wollam V-Vase VB400
  • AFM Bruker Dimension Icon
  • Photoinduced Spectroscopy setup
  • UV-VIS Spectrometer Shimadzu UV-3600
  • FTIR Spectrometer Shimadzu IRTracer-100
  • Confocal microsope Nikon Eclipse Ti


Device characterization

If we want to evaluate the electrical behaviour and performance of our devices, we can choose from a number of state-of-the-art measurement tools:

  • EQE measurement setups
  • Solar simulators
  • 2 probestations in N2 atmosphere with microscopes
  • 2 low temperature probestations (incl. Janis ST500, down to 4.2K)
  • IV Analyzers / Semiconductor Characterization Systems: Agilent E5262A, E5270B & Keithley 4200-SCS
  • SMU’s: Keysight B2912A,  Keithley 2400’s, a number of other Keithley models